The Inspire Burn-in System is mainly used for testing digital IC's. Every slot provides 96+ drive, 64 monitor channels, and 4 power supplies. This system supports Incal 160 style BIB. The standard oven is a 56 slot system, but other options as well as Prescreen Stations are available.

BIB Format

• 12.32"W x 23.85"L x 62mil thick
• 50mil spacing, 212 pin edge finger for signaling (drive/monitor)
• 156mil edge fingers for power supplies (60A current)
• 96 drive & 64 monitoring channels
• 16-bit BIB ID
• Supports iSocket requirements

Inspire Application

• Runs natively on Windows XP and Windows 7
• Application controls/ monitors all aspect of Burn-in
• Recipe/Pattern Editors
• Built-in Logger for system events, temperature and lots
• Programmable logging interval
• GUI logic analyzer
• Color-coded fail monitoring

4:1 Architecture

• One Driver for 4 BIB
• Only 14 drivers for 56 slot system
• Reduces system cost
• INCAL SST Backplanes
• Pass Marker allows driver to sample on one BIB for entire pattern length for effective monitoring

Power Sources

• Up to 16 Power Supplies controlled and Monitored
• Many zoning schemes available
• Positive or negative voltage
• Sequencing and delays
• Under/Over Voltage shutdown
• Many power supplies to choose
• GPIB or LXI
• Slot current monitoring

160 Drive and Monitor

• Reliable Burn-in driver
• 25Mhz with 16Meg depth
• VOH: 0.5V to 5.5V
• Drive shorts monitoring
• 4-point Clock Skew/ RZ formatting on all channels
• Four types of monitoring available on all channels
• Opt Module: 16 analog channels

System Configuration: Chambers

• HTOL (56 slot, 75ºC to 155ºC)
• LTOL (POTC) (24 slot, -55ºC to 155ºC)
• Dual Stack (8 Slot (x2), 75ºC to 155ºC) Multi Chamber

Prescreen Bench Options

• Full Bench w/Fixture
• Compact Cube w/Fixture